Pascal Gentsch

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Related publications (1)

Please note that this is not a complete list of this person’s publications. It includes only semantically relevant works. For a full list, please refer to Infoscience.

6 DOF repeatability measurement setup for measuring position of assembled silicon parts with nanometric resolution

Simon Nessim Henein, François Barrot, Florent Cosandier, Johannes Richard Cornelis Geerit Kruis, Pascal Gentsch

This article presents a test setup dedicated to the measurement of the 6 degrees of freedom relative positioning assembly repeatability of three micro-manufactured parts equivalent to those composing a mesoscale flexure-based robot. The typical size of the ...

2015

Related publications (1)

Please note that this is not a complete list of this person’s publications. It includes only semantically relevant works. For a full list, please refer to Infoscience.

6 DOF repeatability measurement setup for measuring position of assembled silicon parts with nanometric resolution

Simon Nessim Henein, François Barrot, Florent Cosandier, Johannes Richard Cornelis Geerit Kruis, Pascal Gentsch

2015