Publication

Longitudinal and transverse modulation of electron wave function with light, and its application to electron microscopy

Fabrizio Carbone, Ivan Madan, Giovanni Maria Vanacore, Enrico Pomarico, Gabriele Berruto, Ido Kaminer
2021
Conference Papers

Abstract

Conventional electron microscopy operates with flat electron wave fronts. Employing attenuative or electrostatic phase plates allows transversally modulating the wave front, enhancing cross-sections of particular scattering channels. Utilization of light from coherent ultrafast sources allows modulating electrons phase both transversally and longitudinally. This results in a plethora of phenomena, as well as conceptually new techniques such as non-local electron holography of light fields and generation of ultrafast electron vortex beams, which we present in this contribution.

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https://infoscience.epfl.ch/entities/publication/15d3a5dc-c7c1-4105-aedf-cde9744604fa

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Fabrizio Carbone, Ivan Madan, Giovanni Maria Vanacore, Enrico Pomarico, Gabriele Berruto, Ido Kaminer
2021
Conference Papers

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/15d3a5dc-c7c1-4105-aedf-cde9744604fa

About this result

Related concepts (20)

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

Scanning transmission electron microscopy

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.

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