Publication

Reverse precipitation synthesis and characterization of CeO2 nanopowder

Mehdi Mazaheri
2010
Journal Articles

Abstract

In the present work, CeO2 nanopowder was synthesized via a reverse precipitation method using CeCl3 center dot 7H(2)O, NH4OH and sodium dodecyl sulfate as raw materials. The effect of thermal treatment on the crystal growth, surface area and chemical bonds of the powder was discussed. The structural evolutions and morphological characteristics of the nanopowder were investigated using X-ray diffractometery, transmission electron microscopy, scanning electron microscopy, differential thermal analysis and Fourier transform infrared spectroscopy. The results showed that CeO2 with an average particle size of 45 nm is formed. The BET surface area increased to approximate to 41 m(2)/g, with increasing calcination to 300 degrees C; then, it decreased following calcination at higher temperatures. The particles sintered and agglomerateed together after 500 degrees C. The activation energy for CeO2 nanocrystallite growth during calcination was calculated to be about 14.6 kJ/mol. (C) 2009 Elsevier B.V. All rights reserved.

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https://infoscience.epfl.ch/entities/publication/4a00951e-fc0a-436a-9d36-2fba02eb2ee9

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Mehdi Mazaheri
2010
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/4a00951e-fc0a-436a-9d36-2fba02eb2ee9

About this result

Related concepts (32)

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Scanning transmission electron microscopy

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

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