Publication
Using the Y-function method, this paper experimentally investigates the effects of total ionizing dose up to 1 Grad on the channel mobility of a commercial 28-nm bulk CMOS process.
Sylvain Dunand, Nicolas Würsch, Jonathan Emanuel Thomet, Luca Massimiliano Antognini, Matthew James Large
Sylvain Dunand, Nicolas Würsch, Giulia Rossi, Matthew James Large
Edoardo Charbon, Ashish Sharma, Francesco Piro