Publication

Fabrication of homogeneous titania/MWNT composite materials

László Forró, Arnaud Magrez, Jin Won Seo, Klara Hernadi
2011
Journal Articles

Abstract

MWNT/titania nanocomposites were prepared by an impregnation method and subsequent heat treatment at 400 degrees C. Precursor compounds such as titanium (IV) propoxide and titanium (IV) ethoxide were used to cover the surface of CNTs under solution conditions. Electron microscopy and X-ray diffraction techniques were carried out to characterize the as-prepared titania layers. (C) 2011 Elsevier Ltd. All rights reserved.

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https://infoscience.epfl.ch/entities/publication/79511dbd-abfe-44e9-a5f1-28669b4f844e

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László Forró, Arnaud Magrez, Jin Won Seo, Klara Hernadi
2011
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/79511dbd-abfe-44e9-a5f1-28669b4f844e

About this result

Related concepts (12)

X-ray scattering techniques

X-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystal structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy.

Powder diffraction

Powder diffraction is a scientific technique using X-ray, neutron, or electron diffraction on powder or microcrystalline samples for structural characterization of materials. An instrument dedicated to performing such powder measurements is called a powder diffractometer. Powder diffraction stands in contrast to single crystal diffraction techniques, which work best with a single, well-ordered crystal. Diffraction grating The most common type of powder diffraction is with x-rays, the focus of this article although some aspects of neutron powder diffraction are mentioned.

X-ray crystallography

X-ray crystallography is the experimental science determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract into many specific directions. By measuring the angles and intensities of these diffracted beams, a crystallographer can produce a three-dimensional picture of the density of electrons within the crystal. From this electron density, the mean positions of the atoms in the crystal can be determined, as well as their chemical bonds, their crystallographic disorder, and various other information.

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