Publication

Slip in directionally solidified Mo-alloy micropillars - Part I: Nominally dislocation-free pillars

Cécile Hébert, Helena Van Swygenhoven, Emad Oveisi, Barbora Bártová, Steven Van Petegem, Camelia Borca, Cécile Renée Maria Marichal
2012
Journal Articles

Abstract

In situ Laue analysis during microcompression reveals plasticity in [0 0 1]-oriented, directionally solidified Mo alloy pillars to start with slip on the {1 1 2} < 1 1 1 > system having the highest Schmid factor followed by slip on the (1 1 0) plane containing the same Burgers vector. The results are interpreted in terms of the microstructure analyzed by scanning transmission electron microscopy and 3-D atom probe. (C) 2012 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

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https://infoscience.epfl.ch/entities/publication/828114f5-c6f0-4ce3-aca4-6ef2651547bc

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Cécile Hébert, Helena Van Swygenhoven, Emad Oveisi, Barbora Bártová, Steven Van Petegem, Camelia Borca, Cécile Renée Maria Marichal
2012
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/828114f5-c6f0-4ce3-aca4-6ef2651547bc

About this result

Related concepts (13)

Burgers vector

In materials science, the Burgers vector, named after Dutch physicist Jan Burgers, is a vector, often denoted as b, that represents the magnitude and direction of the lattice distortion resulting from a dislocation in a crystal lattice. The vector's magnitude and direction is best understood when the dislocation-bearing crystal structure is first visualized without the dislocation, that is, the perfect crystal structure.

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

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