Publication

Influence of processing and conduction materials on properties of co-fired resistors in LTCC structures

Peter Ryser, Thomas Maeder, Hansu Birol
2006
Journal Articles

Abstract

The motivation of this study is the need for fundamental understanding of the effects of processing conditions on the electrical properties of low- temperature co-fired ceramic (LTCC) tapes, those screen printed with commercial thick-film pastes of electronic components for increased reliability. The method of the study is realized by analyzing the physical and chemical effects of mono/multilayer firing and firing temperatures on the temperature coefficient of resistance (TCR) and sheet resistance (SR) values of the positive temperature coefficient (PTC) resistors screen-printed on LTCC tapes. The results are discussed with respect to the information obtained by the scanning electron microscopy (SEM), electro dispersive X-ray analysis (EDXS), X-ray and dilatometry analysis. It is shown that the content of pastes combined with varying processing conditions result in deviation from expected TCR and SR values due to the chemical and/or mechanical reactions.

Official source

https://infoscience.epfl.ch/entities/publication/9b07892b-c020-4eed-829a-0c24fcfb615d

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Peter Ryser, Thomas Maeder, Hansu Birol
2006
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/9b07892b-c020-4eed-829a-0c24fcfb615d

About this result

Related concepts (32)

Temperature coefficient

A temperature coefficient describes the relative change of a physical property that is associated with a given change in temperature. For a property R that changes when the temperature changes by dT, the temperature coefficient α is defined by the following equation: Here α has the dimension of an inverse temperature and can be expressed e.g. in 1/K or K−1. If the temperature coefficient itself does not vary too much with temperature and , a linear approximation will be useful in estimating the value R of a property at a temperature T, given its value R0 at a reference temperature T0: where ΔT is the difference between T and T0.

Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

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