Publication

RTS Noise Characterization in Single-Photon Avalanche Diodes

Edoardo Charbon, Lucio Carrara, Cristiano Niclass, Mohammad Azim Karami, Matthew Fishburn
2010
Journal Articles

Abstract

Random telegraph signal (RTS) behavior is reported and characterized in the dark count rate of single-photon avalanche Diodes (SPADs). The RTS is observed in a SPAD fabricated in 0.8-mu m CMOS technology and in four proton-irradiated SPADs designed and fabricated in 0.35-mu m CMOS technology. The RTS characteristics are evaluated experimentally and verified theoretically with respect to bias and temperature.

Official source

https://infoscience.epfl.ch/entities/publication/bab3dd92-4502-4f5a-ba9e-d7124ee229e9

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Edoardo Charbon, Lucio Carrara, Cristiano Niclass, Mohammad Azim Karami, Matthew Fishburn
2010
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/bab3dd92-4502-4f5a-ba9e-d7124ee229e9

About this result

Related concepts (6)

CMOS

Complementary metal–oxide–semiconductor (CMOS, pronounced "sea-moss", siːmɑːs, -ɒs) is a type of metal–oxide–semiconductor field-effect transistor (MOSFET) fabrication process that uses complementary and symmetrical pairs of p-type and n-type MOSFETs for logic functions. CMOS technology is used for constructing integrated circuit (IC) chips, including microprocessors, microcontrollers, memory chips (including CMOS BIOS), and other digital logic circuits.

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