Confocal microscopyConfocal microscopy, most frequently confocal laser scanning microscopy (CLSM) or laser scanning confocal microscopy (LSCM), is an optical imaging technique for increasing optical resolution and contrast of a micrograph by means of using a spatial pinhole to block out-of-focus light in image formation. Capturing multiple two-dimensional images at different depths in a sample enables the reconstruction of three-dimensional structures (a process known as optical sectioning) within an object.
Near-field scanning optical microscopeNear-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. In SNOM, the excitation laser light is focused through an aperture with a diameter smaller than the excitation wavelength, resulting in an evanescent field (or near-field) on the far side of the aperture.
MicroscopyMicroscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye (objects that are not within the resolution range of the normal eye). There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy. Optical microscopy and electron microscopy involve the diffraction, reflection, or refraction of electromagnetic radiation/electron beams interacting with the specimen, and the collection of the scattered radiation or another signal in order to create an image.
Scanning electron microscopeA scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.
Atomic force microscopyAtomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Scanning probe microscopyScanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.
Scanning tunneling microscopeA scanning tunneling microscope (STM) is a type of microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986. STM senses the surface by using an extremely sharp conducting tip that can distinguish features smaller than 0.1 nm with a 0.01 nm (10 pm) depth resolution. This means that individual atoms can routinely be imaged and manipulated.
Scanning transmission electron microscopyA scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.
Optical sectioningOptical sectioning is the process by which a suitably designed microscope can produce clear images of focal planes deep within a thick sample. This is used to reduce the need for thin sectioning using instruments such as the microtome. Many different techniques for optical sectioning are used and several microscopy techniques are specifically designed to improve the quality of optical sectioning. Good optical sectioning, often referred to as good depth or z resolution, is popular in modern microscopy as it allows the three-dimensional reconstruction of a sample from images captured at different focal planes.
ImageAn image is a visual representation of something. An image can be a two-dimensional (2D) representation, such as a drawing, painting, or photograph, or a three-dimensional (3D) object, such as a carving or sculpture. An image may be displayed through other media, including projection on a surface, activation of electronic signals, or digital displays. Two-dimensional images can be still or animated. Still images can usually be reproduced through mechanical means, such as photography, printmaking or photocopying.
Super-resolution microscopySuper-resolution microscopy is a series of techniques in optical microscopy that allow such images to have resolutions higher than those imposed by the diffraction limit, which is due to the diffraction of light. Super-resolution imaging techniques rely on the near-field (photon-tunneling microscopy as well as those that use the Pendry Superlens and near field scanning optical microscopy) or on the far-field.
Electron microscopeAn electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.
Object-oriented programmingObject-Oriented Programming (OOP) is a programming paradigm based on the concept of "objects", which can contain data and code. The data is in the form of fields (often known as attributes or properties), and the code is in the form of procedures (often known as methods). A common feature of objects is that procedures (or methods) are attached to them and can access and modify the object's data fields. In this brand of OOP, there is usually a special name such as or used to refer to the current object.
Object modelIn computing, object model has two related but distinct meanings: The properties of objects in general in a specific computer programming language, technology, notation or methodology that uses them. Examples are the object models of Java, the Component Object Model (COM), or Object-Modeling Technique (OMT). Such object models are usually defined using concepts such as class, generic function, message, inheritance, polymorphism, and encapsulation.
Object (computer science)In computer science, an object can be a variable, a data structure, a function, or a method. As regions of memory, objects contain a value and are referenced by identifiers. In the object-oriented programming paradigm, an object can be a combination of variables, functions, and data structures; in particular in class-based variations of the paradigm, an object refers to a particular instance of a class. In the relational model of database management, an object can be a table or column, or an association between data and a database entity (such as relating a person's age to a specific person).
Object lifetimeIn object-oriented programming (OOP), the object lifetime (or life cycle) of an object is the time between an object's creation and its destruction. Rules for object lifetime vary significantly between languages, in some cases between implementations of a given language, and lifetime of a particular object may vary from one run of the program to another. In some cases, object lifetime coincides with variable lifetime of a variable with that object as value (both for static variables and automatic variables), but in general, object lifetime is not tied to the lifetime of any one variable.
Object databaseAn object database or object-oriented database is a database management system in which information is represented in the form of objects as used in object-oriented programming. Object databases are different from relational databases which are table-oriented. A third type, object–relational databases, is a hybrid of both approaches. Object databases have been considered since the early 1980s. Object-oriented database management systems (OODBMSs) also called ODBMS (Object Database Management System) combine database capabilities with object-oriented programming language capabilities.
Image editingImage editing encompasses the processes of altering s, whether they are digital photographs, traditional photo-chemical photographs, or illustrations. Traditional analog image editing is known as photo retouching, using tools such as an airbrush to modify photographs or editing illustrations with any traditional art medium. Graphic software programs, which can be broadly grouped into vector graphics editors, raster graphics editors, and 3D modelers, are the primary tools with which a user may manipulate, enhance, and transform images.
