Publication

Method and apparatus of using a scanning probe microscope

Georg Fantner, Adrian Pascal Nievergelt, Jonathan David Adams
2016
Patents

Abstract

a scanning probe microscope for high-speed imaging and/or nanomechanical mapping. The microscope comprises a scanning probe comprising a cantilever with a tip at the distal end; and means for modulating a tip-sample distance separating the tip from an intended sample to be viewed with the microscope, the means for modulating being adapted to provide a direct cantilever actuation.

Official source

https://infoscience.epfl.ch/entities/publication/c868c9b2-c840-4555-a6c2-643f5e0db9e4

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Georg Fantner, Adrian Pascal Nievergelt, Jonathan David Adams
2016
Patents

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/c868c9b2-c840-4555-a6c2-643f5e0db9e4

About this result

Related concepts (14)

Atomic force microscopy

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

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A microscope () is a laboratory instrument used to examine objects that are too small to be seen by the naked eye. Microscopy is the science of investigating small objects and structures using a microscope. Microscopic means being invisible to the eye unless aided by a microscope. There are many types of microscopes, and they may be grouped in different ways.

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