Publication

Improving Energy-Efficiency in Dynamic Memories Through Retention Failure Detection

Adam Shmuel Teman, Robert Giterman
2019
Journal Articles

Abstract

A gain-cell embedded DRAM (GC-eDRAM) is an attractive logic-compatible alternative to the conventional static random access memory (SRAM) for the implementation of embedded memories, as it offers higher density, lower leakage, and two-ported operation. However, it requires periodic refresh cycles to maintain its data which deteriorates due to leakage. The refresh-rate, which is traditionally set according to the worst cell in the array under extreme operating conditions, leads to a significant refresh power consumption and decreased memory availability. In this paper, we propose to reduce the cost of GC-eDRAM refresh by employing failure detection to lower the refresh-rate. A 4T dynamic complementary dual-modular redundancy bitcell is proposed to offer per-bit error detection, resulting in a substantial decrease in the refresh-rate and over 60% power reduction compared with the SRAM. The proposed approach is also compared with the conventional SRAM and GCeDRAM implementations with integrated error correction codes, demonstrating significant area and latency reductions.

Official source

https://infoscience.epfl.ch/entities/publication/cdec954f-bf18-4d01-9c20-c5e5806ae011

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Adam Shmuel Teman, Robert Giterman
2019
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/cdec954f-bf18-4d01-9c20-c5e5806ae011

About this result

Related concepts (16)

Dynamic random-access memory

Dynamic random-access memory (dynamic RAM or DRAM) is a type of random-access semiconductor memory that stores each bit of data in a memory cell, usually consisting of a tiny capacitor and a transistor, both typically based on metal–oxide–semiconductor (MOS) technology. While most DRAM memory cell designs use a capacitor and transistor, some only use two transistors. In the designs where a capacitor is used, the capacitor can either be charged or discharged; these two states are taken to represent the two values of a bit, conventionally called 0 and 1.

Random-access memory

Random-access memory (RAM; ræm) is a form of computer memory that can be read and changed in any order, typically used to store working data and machine code. A random-access memory device allows data items to be read or written in almost the same amount of time irrespective of the physical location of data inside the memory, in contrast with other direct-access data storage media (such as hard disks, CD-RWs, DVD-RWs and the older magnetic tapes and drum memory), where the time required to read and write data items varies significantly depending on their physical locations on the recording medium, due to mechanical limitations such as media rotation speeds and arm movement.

Flash memory

Flash memory is an electronic non-volatile computer memory storage medium that can be electrically erased and reprogrammed. The two main types of flash memory, NOR flash and NAND flash, are named for the NOR and NAND logic gates. Both use the same cell design, consisting of floating gate MOSFETs. They differ at the circuit level depending on whether the state of the bit line or word lines is pulled high or low: in NAND flash, the relationship between the bit line and the word lines resembles a NAND gate; in NOR flash, it resembles a NOR gate.

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