Concept

Microscopie électronique en transmission

Cours associés (32)

MSE-637(a): Transmission electron microscopy and diffraction (a)

This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics

MSE-735: Scanning and Analytical Transmission Electron Microscopy

This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who

MSE-609: 21Intro Scanning electron microscopy techniques

Modern Scanning Electron Microscopes, when combined with Focused Ion Beams (Dual beam FIB-SEM), provide a larger number of multimodal imaging and analysis/characterisation modes at the nano- and micro

MSE-486: Organic electronic materials

This course will introduce students to the field of organic electronic materials. The goal of this course is to discuss the origin of electronic properties in organic materials, charge transport mecha

CH-353: Introduction to electronic structure methods

Repetition of the basic concepts of quantum mechanics and main numerical algorithms used for practical implementions. Basic principles of electronic structure methods:Hartree-Fock, many body perturbat

PHYS-207(a): General physics : quanta

Ce cours est une introduction à la mécanique quantique. En partant de son développement historique, le cours traite les notions de complémentarité quantique et le principe d'incertitude, le processus

EE-517: Bio-nano-chip design

Introduction to heterogeneous integration for Nano-Bio-CMOS sensors on Chip. Understanding and designing of active Bio/CMOS interfaces powered by nanostructures.

PHYS-452: Radiation detection

The course presents the detection of ionizing radiation in the keV and MeV energy ranges. Physical processes of radiation/matter interaction are introduced. All steps of detection are covered, as well

MSE-619: Nanofabrication with focused electron and ion beams

Nanofabrication with focused charged particle beams (SEM, FIB) and their applications such as lithography, gas assisted deposition / etching, and milling are discussed and the limitations of these pro

MSE-715: Fundamentals of STEM lmaging and Spectroscopy

Lectures as well as hands-on trainings concerning different STEM imaging and spectroscopy techniques. Fundamentals of STEM, basic and advanced STEM imaging (ABF, ADF, iDPC, and 4D STEM), aberration-co

MSE-675: Introduction to SEM and FIB microanalysis

Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multi-modal imaging and different analytical methods. The course format consists

BIOENG-518: Methods: from disease models to therapy

This course will describe methods underlying translational approaches from disease modeling and characterization to therapeutic applications. The presented techniques will be complemented by hands-on