Publication

Sub-Rayleigh resolution by phase imaging

Christian Depeursinge, Nicolas Pavillon, Etienne Shaffer, Muhammed Fatih Toy, Yann Jérôme Michel Pascal Cotte
2010
Journal Articles

Résumé

We report the experimental observation of systematically occurring phase singularities in coherent imaging of sub-Rayleigh distanced objects. A theory that relates the observation to the sub-Rayleigh distance is presented and compared with experimental measurements. As a consequence, the limit of resolution with coherent illumination is extended by a factor of 1.64×.

Source officielle

https://infoscience.epfl.ch/entities/publication/5ce340ff-ab44-4714-8b1b-803b1b8f919d

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Christian Depeursinge, Nicolas Pavillon, Etienne Shaffer, Muhammed Fatih Toy, Yann Jérôme Michel Pascal Cotte
2010
Journal Articles

Résumé

Source officielle

https://infoscience.epfl.ch/entities/publication/5ce340ff-ab44-4714-8b1b-803b1b8f919d

À propos de ce résultat

Concepts associés (12)

Phase-contrast imaging

Phase-contrast imaging is a method of that has a range of different applications. It measures differences in the refractive index of different materials to differentiate between structures under analysis. In conventional light microscopy, phase contrast can be employed to distinguish between structures of similar transparency, and to examine crystals on the basis of their double refraction. This has uses in biological, medical and geological science.

Phase-contrast X-ray imaging

Phase-contrast X-ray imaging or phase-sensitive X-ray imaging is a general term for different technical methods that use information concerning changes in the phase of an X-ray beam that passes through an object in order to create its images. Standard X-ray imaging techniques like radiography or computed tomography (CT) rely on a decrease of the X-ray beam's intensity (attenuation) when traversing the sample, which can be measured directly with the assistance of an X-ray detector.

Microscope optique en champ proche

Le microscope optique en champ proche (MOCP, ou SNOM pour scanning near-field optical microscope ou NSOM pour near-field scanning optical microscopy) ou microscope optique à sonde locale (MOSL) est un type de microscope à sonde locale qui permet d'imager des objets à partir de la détection des ondes évanescentes confinées au voisinage de leur surface (détection en champ proche optique). Le MOCP permet de compenser la diffraction, une des limitations de la microscopie optique.

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