Lectures related to Asynchronous circuit

Covers dynamic memory elements, latches, flip-flops, timing parameters, clock skew, and synchronous pipelining.

Explores sequential logic circuits, flip-flops, binary counting, and memory registers in digital systems.

Covers principles of synchronous RTL design, custom digital circuits, Y-Diagram visualization, signal classes, and hierarchy management.

Covers fundamental concepts of logic systems, including sequential and combinatorial circuits, state diagrams, and finite state machines.

Explores undetermined states in D-flip-flops, multiplexers, tri-state gates, decoders, and complex binary decoders.

Explores synchronous logic circuits, state-based modeling, optimization techniques, and finite-state machine state minimization.

Covers VLSI design basics, including scaling, technology, MOSFET operation, and logic circuit implementation.

Explores the operation principle of asynchronous machines, emphasizing rotor-stator interaction and slip definition.

Explores synchronous logic circuits, modeling techniques, state minimization, and finite-state machine optimization for area reduction.

Covers pulse generation, edge detection, common design mistakes, and clock/reset signals in logic circuits.

Introduces sequential logic circuits and memory elements, focusing on their role in digital systems and practical applications.

Covers timing analysis of synchronous circuits, focusing on flip-flops, timing constraints, and metastability issues.

Covers structural models, synthesis approaches, and retiming techniques for sequential circuits.

Covers the characteristics of torque in asynchronous machines and variable voltage supply.

Covers the structural model for sequential circuits, synchronous logic networks, and approaches to sequential synthesis including retiming.

Explores quantum and nanocomputing, emphasizing device physics and logic circuits.

Covers torque characteristics, power balance equations, and operating modes with batteries.

Covers linked and unlinked faults in VLSI systems, March test algorithms, critical paths, and path-delay fault testing.

Covers the generation of test vector patterns, fault modeling, structural vs. functional tests, and the implementation of time-frame expansion.

Introduces clocked systems, sequential circuits, bistable-state devices, metastable states, and D-type flip-flops.