Covers protein mass spectrometry, proteomics fundamentals, ionization sources, analyzers, detectors, mass accuracy, resolution, and various ionization methods.
Explores the principles and applications of Focused Ion Beam technology, covering imaging, milling, TEM sample preparation, nanofabricated structures, and 3D microscopy.
Explores micro- and nanoelectromechanical systems, including practical applications, RF resonators, motion detection, and sensitive mass detection using carbon nanotubes.
Explores surface analysis methods using electrons, ions, atoms, and photons, emphasizing the importance of ToF-SIMS for in-depth surface analysis in various fields.
