Covers the historical increase in memory cells per chip, the importance of memory in modern IC architectures, the dramatic increase in test time, and various memory faults.
Explores the roles of testing in VLSI systems, different testing methodologies, cost analysis, factors affecting yield, and the importance of testing in modern technologies.
Explores Built-In Self-Test (BIST) techniques in VLSI systems, covering benefits, drawbacks, implementation details, and the use of Linear Feedback Shift Registers (LFSRs) for test pattern generation.
Explores response compaction techniques in VLSI testing, including one's count compactor, transition count compactor, parity checking, LFSR, MISR, and BILBO.
