Lectures in course MICRO-428: Metrology

Metrology: Introduction

Introduces the concept of metrology, covering electrical, optical, and quantum measurements, with insights into the history and evolution of the International System of Units.

Introduction to Metrology

Covers nanoscale metrology, optical microscopy, atomic force microscopy, electron microscopy, and the redefinition of units.

Revision of the SI: International System of Units

Explores the revision of the International System of Units, focusing on the kilogram, ampere, kelvin, and mole, and the impact on scientific measurements.

Elements of Statistics

Introduces key statistical concepts like probability, random variables, and correlation, with examples and explanations.

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Elements of Statistics: Exercises

Covers exercises on Bayes' Theorem, moment generating functions, photon counts, disease probabilities, and distribution properties.

Elements of Statistics: Probability, Distributions, and Estimation

Covers probability theory, distributions, and estimation in statistics, emphasizing accuracy, precision, and resolution of measurements.

Elements of Statistics: Memorylessness, Stationary Processes, Estimation using MLE

Explores memorylessness in distributions, stationary processes, and estimation using MLE.

Electrical Metrology: Noise and Signal Analysis

Explores electrical metrology, emphasizing noise and signal analysis, covering topics such as charges, currents, voltages, and various noise sources.

Electrical Metrology

Explores electrical metrology, covering random variables, noise sources, and their impact on electronic devices.

Electrical Metrology: Thermal Noise in Resistors

Explores thermal noise in resistors, KTC noise formula, noise factor of networks.

Electrical Metrology: Thermal Noise and KTC Noise

Covers thermal noise in resistors and KTC noise in electrical metrology.

Electrical Metrology: Noise Reduction Techniques

Explores noise reduction, ADCs, TDCs, and time-resolved imaging in electrical metrology.

Electrical Metrology: Amplifier Frequency Response and Design Case Study

Explores amplifier frequency response analysis and design case studies in electrical metrology.

Phase-Locked Loops: Basics and Applications

Explores Phase-Locked Loops, Lock-in Amplifiers, and Oscilloscopes in electrical metrology.

Microscopy and Imaging Systems

Covers the fundamental concepts of microscopy, explaining the need for magnification beyond the human eye and introducing advanced imaging techniques.

Optical Image Sensors: Introduction and Architecture

Explores the history, architecture, and specifications of optical image sensors, including noise suppression techniques and measurement methods.

Optical Image Sensors: Abbe's Limit and SPAD Metrology

Covers optical image sensors, Abbe's Limit, sub-resolution pixels, microlenses, vignetting, and single-photon detectors, including SPAD metrology aspects.

High Dynamic Range Imaging: Algorithms and Techniques

Explores High Dynamic Range imaging, explaining how cameras stack multiple exposed pictures to create HDR images.

Electron Microscopy: Basics and Techniques

Introduces the basics of electron microscopy, covering components, interactions, imaging modes, and nanofabrication techniques.