Plasma Heating: Neutral BeamsExplores the limitations of ohmic heating in plasma and the advantages and drawbacks of neutral beam injection for additional plasma heating.
Electron Microscopy: In SituExplores electron microscopy in situ, covering time-resolved techniques and environmental TEM applications for SOFC.
Electron Microscopy: TEMExplores Transmission Electron Microscopy (TEM), covering diffraction patterns, image formation, and contrast mechanisms.
Transmission Electron MicroscopyCovers the principles and applications of Transmission Electron Microscopy, including imaging, diffraction, contrast mechanisms, and in situ techniques.
High Resolution He Ion MicroscopyCovers the ALIS He ion source and its application in high resolution microscopy, providing remarkable surface detail and material contrast.