Publication

Seeing Big with Scanning Electrochemical Microscopy

Hubert Girault, Andreas Stephan Lesch, Fernando Cortes Salazar, Dmitry Momotenko, Gunther Wittstock
2011
Journal Articles

Abstract

Specialized microelectrode probes fabricated in a soft polymer film now make it possible to use scanning electrochemical microscopy to image the reactivity of large, corrugated, tilted, and dry surfaces.

Official source

https://infoscience.epfl.ch/entities/publication/e5b39b1b-3a8b-4251-b1c3-4acfd3a3acd6

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Hubert Girault, Andreas Stephan Lesch, Fernando Cortes Salazar, Dmitry Momotenko, Gunther Wittstock
2011
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/e5b39b1b-3a8b-4251-b1c3-4acfd3a3acd6

About this result

Related concepts (5)

Scanning probe microscopy

Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.

Scanning tunneling microscope

A scanning tunneling microscope (STM) is a type of microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986. STM senses the surface by using an extremely sharp conducting tip that can distinguish features smaller than 0.1 nm with a 0.01 nm (10 pm) depth resolution. This means that individual atoms can routinely be imaged and manipulated.

Atomic force microscopy

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

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