Publications associées à Sonde ionique focalisée

Controlling crystal cleavage in focused ion beam shaped specimens for surface spectroscopy

Philip Johannes Walter Moll, Matthias Carsten Putzke, Andrew Scott Hunter

Our understanding of quantum materials is commonly based on precise determinations of their electronic spectrum by spectroscopic means, most notably angle-resolved photoemission spectroscopy (ARPES) and scanning tunneling microscopy. Both require atomicall ...

Aip Publishing2024

Identification and thermal healing of focused ion beam-induced defects in GaN using off-axis electron holography

Nicolas Grandjean, Jean-François Carlin, Raphaël Butté, Yi Wang

Thermal healing of focused ion beam-implanted defects in GaN is investigated by off-axis electron holography in TEM. The data reveal that healing starts at temperatures as low as about 250 degrees C. The healing processes result in an irreversible transiti ...

Iop Publishing Ltd2024

Advances in High-Speed, Multiparametric Atomic Force Microscopy

Santiago Harald Andany

After decades of technological advancements, high-speed atomic force microscopy (HS-AFM) has emerged as a powerful technique for visualizing dynamic processes. At the nanoscale, the AFM provides valuable insights into the sample by sensing minute interacti ...

EPFL2024

Numerical investigation of two-dimensional Mode-II delamination in composite laminates

Thomas Keller, Anastasios Vassilopoulos, Congzhe Wang

Existing standards for delamination tests on composite materials typically employ one-dimensional (1D) beam specimens. However, such specimens may not represent real delamination scenarios in composite structures, where cracks tend to propagate in two dime ...

Elsevier Sci Ltd2024

Correlating cryo-super resolution radial fluctuations and dual-axis cryo-scanning transmission electron tomography to bridge the light-electron resolution gap

Prabhu Prasad Swain

Visualization of organelles and their interactions with other features in the native cell remains a challenge in modern biology. We have introduced cryo-scanning transmission electron tomography (CSTET), which can ac-cess 3D volumes on the scale of 1 micro ...

Elsevier2023

Room-temperature strength of the interfacial bond between silica inclusions and iron

Andreas Mortensen, Alejandra Inés Slagter, David Hernandez Escobar, Sergio Perosanz Amarillo

The strength of the interface between iron (Fe) and individual spherical silica (SiO2) inclusions of 5 +/- 1 mu m diameter is measured by means of in-situ micro-cantilever bending tests conducted under displacement control within a scanning electron micros ...

Pergamon-Elsevier Science Ltd2023

FIB-Fabrication of Resonating Cantilevers to Explore Symmetry-Breaking in Quantum Materials

Amelia Emily-Kay Estry

Scientific progress and technological advancements on novel materials are often deterred by limitations on size and quality of samples. Materials with electronic phenomena attractive for applications, and presenting many open scientific questions, are ofte ...

EPFL2023

Characterization of transversely confined electron beam-generated plasma using two-dimensional particle-in-cell simulations

Haomin Sun, Guang-Yu Sun

Electron beam-generated plasmas (EBPs) have been used to modify the surface properties. In certain applications, EBPs are transversely confined and their properties are of value to the treatment. In this paper, the characteristics of an electron beam-gener ...

American Institute of Physics (AIP)2023

Toward a brightness upgrade to the SwissFEL: A high gradient traveling-wave rf photogun

Mike Seidel, Sven Reiche, Paolo Craievich, Anastasiya Magazinik

The first generation of S-band injectors for free-electron lasers has illustrated high reliability and performance by driving the latest generation of high brightness machines. However, the ultimate electron beam brightness of these devices is limited by t ...

Amer Physical Soc2023

Ionic Liquid Gating of SrTiO3 Lamellas Fabricated with a Focused Ion Beam

Amelia Emily-Kay Estry, Philip Johannes Walter Moll, Evgeny Mikheev

In this work, we combine two previously incompatible techniques for defining electronic devices: shaping three-dimensional crystals by focused ion beam (FIB), and two-dimensional electrostatic accumulation of charge carriers. The principal challenge for th ...

AMER CHEMICAL SOC2022

Poisoning Effects of Cerium Oxide (CeO2) on the Performance of Proton Exchange Membrane Fuel Cells (PEMFCs)

Jan Van Herle, Hossein Pourrahmani

In this study, the poisoning effects of cerium oxide (CeO2) as the contaminant on the performance of proton exchange membrane fuel cells (PEMFCs) are evaluated. An experimental setup was developed to analyze the performance characteristic (I-V) curves in c ...

MDPI2022

From pulsed-DCMS and HiPIMS to microwave plasma-assisted sputtering: Their influence on the properties of diamond-like carbon films

Aïcha Hessler-Wyser, Johann Michler, Caroline Hain, David Brown, Thomas Nelis

The fabrication of high-hardness non-hydrogenated diamond-like carbon (DLC) via standard magnetron sputtering (MS) is often hindered by the low sputtering yields and ionisation rates of carbon, therefore investigations into pulsed alternatives of MS, else ...

ELSEVIER SCIENCE SA2022

Physics-based control of neoclassical tearing modes on TCV

Olivier Sauter, Federico Alberto Alfredo Felici, Cristian Galperti, Mengdi Kong

This paper presents recent progress in studies of neoclassical tearing modes (NTMs) on TCV, concerning the new physics learned and how this physics contributes to a better real-time (RT) control of NTMs. A simple technique that adds a small (sinusoidal) sw ...

IOP Publishing Ltd2022

Bending strain in 3D topological semi-metals

Philip Johannes Walter Moll, Matthias Carsten Putzke, Xiangwei Huang, Jonas De Jesus Diaz Gomez, Amelia Emily-Kay Estry

We present an experimental set-up for the controlled application of strain gradients by mechanical piezoactuation on 3D crystalline microcantilevers that were fabricated by focused ion beam machining. A simple sample design tailored for transport character ...

IOP Publishing Ltd2022

Understanding Wavelength-Dependent Synergies between Morphology and Photonic Design in TiO2-Based Solar Powered Redox Cells

Giulia Tagliabue, Jiaming Ma, Kiseok Oh

Solar powered redox cells (SPRCs) are promising for large-scale and long-term storage of solar-energy, particularly when coupled with redox flow batteries (RFBs). While efforts have primarily focused on heterostructure engineering, the potential of synergi ...

AMER CHEMICAL SOC2023

In situ work function measurements of W, WO3 nanostructured surfaces

Francisco Sanchez

Surface nanostructuring enables the fabrication of materials with highly desirable properties. Nanostructured tungsten surfaces have potential applications in solar water splitting. Exposing a polished tungsten surface to helium plasma induces various surf ...

ELSEVIER SCIENCE SA2022

FEM of stress partition during compression of WC-10 wt.% Co with realistic 3D morphology

Daniele Mari, Lucas Eric Jacques Degeneve

A Finite Element Model is developed to represent the mechanical behavior of WC-10 wt.% Co in compression tests. In this research, realistic three-dimensional model is obtained by slicing a sample by Focused Ion Beam and reconstituting it, resulting in two ...

ELSEVIER SCI LTD2022

Magnetic force microscopy contrast formation and field sensitivity

Marcos Penedo Garcia, Johannes Schwenk

The magnetic force microscope (MFM) is an established experimental tool for imaging stray fields with high spatial resolution and sensitivity. The MFM contrast can however contain contributions from the sample topography, variations in the surface Kelvin p ...

2022

Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss Laboratories

Anders Meibom, Stéphane Laurent Escrig, Florent Olivier Vivien Plane, Lukas Baumgartner, Thomas Bovay

Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a localized area of a solid target by performing mass spectrometry on secondary ions sputtered from its surface by the impact of a beam of charged particles. ...

SWISS CHEMICAL SOC2022

Evaluation of secondary electron intensities for dopant profiling in ion implanted semiconductors: a correlative study combining SE, SIMS and ECV methods

Franz-Josef Haug, Aïcha Hessler-Wyser, Quentin Thomas Jeangros, Audrey Marie Isabelle Morisset, Philippe Wyss, Mario Joe Lehmann

This study evaluates the secondary electron (SE) dopant contrast in scanning electron microscopy (SEM) and helium ion microscopy (HIM) on boron implanted silicon sample. Complementary techniques like secondary ion mass spectrometry and electrochemical capa ...

IOP PUBLISHING LTD2021