Publication

Design and characterisation of low-cost thick-film piezoresistive force sensors for the 100 mN to 100 N range

Publications associées (12)

Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process

Oliver Peric, Santiago Harald Andany, Georg Fantner, Jonathan David Adams, Matthias Neuenschwander, Nahid Hosseini

Employing polymer cantilevers has shown to outperform using their silicon or silicon nitride analogues concerning the imaging speed of atomic force microscopy (AFM) in tapping mode (intermittent contact mode with amplitude modulation) by up to one order of ...

Beilstein Institut2019

An Analytical Model for Beam Flexure Modules Based on Timoshenko Beam Theory

Simon Nessim Henein, Mohammad Hussein Kahrobaiyan, Mohamed Gamal Abdelrahman Ahmed Zanaty

Short beams are the key building blocks in many compliant mechanisms. Hence, deriving a simple yet accurate model of their elastokinematics is an important issue. Since the Euler-Bernoulli beam theory fails to accurately model these beams, we use the Timos ...

2017

Harnessing the damping properties of materials for high-speed atomic force microscopy

Jürgen Brugger, Jonas Grossenbacher, Georg Fantner, Blake William Erickson, Jonathan David Adams, Adrian Pascal Nievergelt

The success of high-speed atomic force microscopy in imaging molecular motors1, enzymes2 and microbes3 in liquid environments suggests that the technique could be of significant value in a variety of areas of nanotechnology. However, the majority of atomic ...

Nature Publishing Group2016

Ultra Low Noise CMOS Image Sensors

Assim Boukhayma

CMOS Image Sensors (CIS) overtook the charge coupled devices (CCDs) in low noise performance. Photoelectron counting capability is the next step for CIS for ultimate low light performance and new imaging paradigms. This work presents a review of CMOS image ...

EPFL2016

Piezoresistive AFM cantilevers surpassing standard optical beam deflection in low noise topography imaging

Georg Fantner, Jonathan David Adams, Maja Dukic Pjanic

Optical beam deflection (OBD) is the most prevalent method for measuring cantilever deflections in atomic force microscopy (AFM), mainly due to its excellent noise performance. In contrast, piezoresistive strain-sensing techniques provide benefits over OBD ...

Nature Publishing Group2015

Micro and nano tools for magnetic field imaging

Schahrazede-Lila Mouaziz

Scanning probe microscopy has become, nowadays, a branch of microscopy widely used to image surfaces of different specimens. Among the various applications, the magnetic imaging is one of the most exciting scanning probe microscopy techniques. It allows th ...

EPFL2007

Multifunctional all-GFRP joint for concrete slab structures

Thomas Keller, Florian Riebel

An existing hybrid-GFRP/steel joint for load transfer and thermal insulation in concrete slab structures was developed into an all-GFRP joint. The new joint consists of a pultruded GFRP tensile/shear element anchored through adhesively bonded ribs in the c ...

2007

Multifunctional hybrid GFRP/steel joint for concrete slab structures

Thomas Keller, Florian Riebel

A multifunctional hybrid glass fiber-reinforced polymer (GFRP)/steel joint has been developed for the transfer of compression and shear forces in thermal insulation sections of concrete slab structures used in building construction. The new pultruded cellu ...

2006

Polymer-based cantilevers with integrated electrodes

Radivoje Popovic, Giovanni Boero, Jürgen Brugger, Schahrazede-Lila Mouaziz

An innovative release method of polymer cantilevers with embedded integrated metal electrodes is presented. The fabrication is based on the lithographic patterning of the electrode layout on a wafer surface, covered by two layers of SU-8 polymer: a 10-um-t ...

Institute of Electrical and Electronics Engineers2006

Structuration and Fabrication of Sensors Based on LTCC (Low Temperature Co-fired Ceramic) Technology

Thomas Maeder, Peter Ryser, Giancarlo Corradini, Hansu Birol, Caroline Jacq

The purpose of this paper is to demonstrate sensors and structures fabricated using the LTCC technology, which has been addressed and employed increasingly as a smart packaging approach for several applications. The focus will be on inclination and cantile ...

Trans Tech Publications2006

Massively parallel AFM with digital holographic readout

Laurent Sache

The general idea of Nanotechnology is not new – it has been studied since Nobel laureate Richard Feynman outlined the idea in a speech in 1959 – but it's only recently that the progress carried out in the various fields of material, optic, physic and engin ...

EPFL2006

Highly sensitive vertical hall sensors in CMOS technology

Enrico Schurig

Vertical Hall sensors are capable of measuring surface-parallel components of the magnetic field. They allow therefore relatively easy conception of single-chip multi-axial magnetic sensors compared to solutions using horizontal Hall plates. The modern tre ...

EPFL2005